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Keywords: defect pattern
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Proceedings Papers

Paper presented at the 10th ISRM Congress, September 8–12, 2003
Paper Number: ISRM-10CONGRESS-2003-161
... and datasets from mapping of New Zealand closely-jointed greywacke rock masses. Two indices from the contour plots - the area within the 1% contour (A 1% ) and maximum concentration (C max ) are introduced for distinguishing uniform (isotropic), random or regular defect patterns. The indices provide...

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